SEMICONDUCTOR RELIABILITY CHALLENGES
IN ELECTRIC AND AUTONOMOUS
VEHICLES: A SYSTEMATIC REVIEW
Dr. Quazi Taif Sadat
Director Bangladesh University
Abstract. The rapid adoption of electric vehicles (EVs) and autonomous vehicles (AVs) has significantly increased the dependence of automotive systems on advanced semiconductor technologies. These semiconductors must operate reliably under prolonged electrical, thermal, and environmental stress while supporting safety-critical vehicle functions. Unlike conventional automotive electronics, EV and AV platforms demand continuous operation, high power density, and complex system integration, which introduce new reliability challenges. This paper presents a systematic review of recent research addressing semiconductor reliability in electric and autonomous vehicles. Key challenges related to device aging, functional safety compliance, architectural complexity, and qualification limitations are analyzed. The review further highlights emerging research trends and outlines technical directions required to enhance long-term reliability in next-generation automotive semiconductor systems.
How
to cite this paper?
Source: International Journal of Applied Mathematics
ISSN printed version: 1311-1728
ISSN on-line version: 1314-8060
Year: 2025
Volume: 38
Issue: 3
References
[1] Gao, J., Qiu, Y., & Chen, Z. (2025). Systemic integration of electric vehicles and autonomous driving technologies: Implications for reliability and safety. World Electric Vehicle Journal, 16(10), 574. https://doi.org/10.3390/wevj16100574
[2] Ghaedi, A. (2022). Impact of temperature variation on electric vehicle reliability: Challenges and mitigation strategies. Advances in Materials Science and Engineering, 2022, Article 4876218. https://doi.org/10.1155/2022/4876218
[3] Gumus, M., Topal, M., & Yildiz, B. (2025). Risk management and reliability enhancement in autonomous vehicle systems: A systematic review. Machines, 13(8), 646. https://doi.org/10.3390/machines13080646
[4] Hirler, A. (2019). Effective and combined stressors in multidimensional automotive electronics reliability. Microelectronics Reliability, 100, 113410. https://doi.org/10.1016/j.microrel.2019.113410
[5] International Organization for Standardization. (2018). ISO 26262: Road vehicles—Functional safety. ISO.
[6] Kennedy, L., & Alexandrescu, D. (2024). Automotive electronics reliability requires in-field silicon monitoring. SemiEngineering. https://semiengineering.com/automotive-electronics-reliability-requires-in-field-silicon-monitoring/
[7] Narashiman, S., Balasubramanian, K., & Raghavan, S. (2024). Chiplets on wheels: A review of holistic chiplet solutions for autonomous vehicles. arXiv. https://arxiv.org/abs/2403.01245
[8] Shi, B. (2023). A review of silicon carbide MOSFETs in electrified vehicle applications. IET Power Electronics, 16(9), 1589–1605. https://doi.org/10.1049/pel2.12524
[9] Villalobos, A., Barrutia, I., Peña-Alzola, R., Dragicevic, T., & Aizpurua, J. I. (2025). Comparative analysis and evaluation of ageing forecasting methods for semiconductor devices in online health monitoring. arXiv. https://arxiv.org/abs/2501.02417
[10] Zhang, Y., Wang, H., & Li, X. (2024). Reliability evaluation of silicon carbide MOSFET modules for electric vehicles based on mission profiles. Microelectronics Reliability, 148, 115029. https://doi.org/10.1016/j.microrel.2023.115029
[11] I-Connect007. (2025). The road to reliability: Why EV electronics matter more than ever. https://iconnect007.com/article/146890
[12] IDTechEx. (2023). Semiconductors for electric and autonomous vehicles 2023–2033. IDTechEx Research.
[13] MDPI. (2025). Perspectives on safety and reliability for autonomous vehicles. Electronics, 14(3), 512. https://doi.org/10.3390/electronics14030512
[14] Patil, C. A. (2025). The semiconductor reliability standards that shape automotive IC cost and complexity. https://www.chetanpatil.in/the-semiconductor-reliability-standards-that-shape-automotive-ic-cost-and-complexity/
[15] ScienceDirect. (2024). Integrating resilience and reliability in semiconductor supply chains during disruptions. International Journal of Production Economics, 263, 108947. https://doi.org/10.1016/j.ijpe.2023.108947
IJAM
o Home
o Contents